You are here: Start » Function Reference » Computer Vision » 1D Edge Detection
1D Edge Detection
Select a function from the list below.
| Icon | Name | Description / Applications | Modules | |
|---|---|---|---|---|
| CreateScanMap | Precomputes a data object that is required for fast 1D edge detection. Used together with 1D Edge Detection filters (excluding "_Direct"), but can be moved before the loop if only the scan parameters do not change.  | 
		MetrologyBasic | ||
| ScanExactlyNEdges | Locates a specified number of the strongest transitions between dark and bright pixels along a given path. Very fast object detection (or presence verification) when the expected number of edges is clearly defined.  | 
		MetrologyBasic | ||
| ScanExactlyNEdges_Direct | Locates a specified number of the strongest transitions between dark and bright pixels along a given path (without a scan map). Very fast object detection (or presence verification) when the expected number of edges is clearly defined.  | 
		MetrologyBasic | ||
| ScanExactlyNRidges | Locates a specified number of the strongest dark or bright pixel peak along a given path. Very fast detection (or presence verification) of thin structures like wires or scale marks.  | 
		MetrologyBasic | ||
| ScanExactlyNRidges_Direct | Locates a specified number of the strongest dark or bright pixel peak along a given path (without a scan map). Very fast detection (or presence verification) of thin structures like wires or scale marks.  | 
		MetrologyBasic | ||
| ScanExactlyNStripes | Locates a specified number of multiple pairs of opposite edges across a given path. Very fast detection (or presence verification) of multiple pairs of opposite edges.  | 
		MetrologyBasic | ||
| ScanExactlyNStripes_Direct | Locates a specified number of multiple pairs of opposite edges across a given path (without a scan map). Very fast detection (or presence verification) of multiple pairs of opposite edges.  | 
		MetrologyBasic | ||
| ScanMultipleEdges | Locates multiple transitions between dark and bright pixels along a given path. Very fast detection of multiple edge points - usually for object counting or displacement detection.  | 
		MetrologyBasic | ||
| ScanMultipleEdges_Direct | Locates multiple transitions between dark and bright pixels along a given path (without a scan map). Very fast detection of multiple edge points - usually for object counting or displacement detection.  | 
		MetrologyBasic | ||
| ScanMultipleRidges | Locates multiple dark or bright pixel peaks along a given path. Very fast detection of multiple thin structures like wires or scale marks - usually for counting or distance measurements.  | 
		MetrologyBasic | ||
| ScanMultipleRidges_Direct | Locates multiple dark or bright pixel peaks along a given path (without a scan map). Very fast detection of multiple thin structures like wires or scale marks - usually for counting or distance measurements.  | 
		MetrologyBasic | ||
| ScanMultipleStripes | Locates multiple pairs of edges across a given path. Very fast detection of multiple pairs of opposite edges - usually for counting or width measurements.  | 
		MetrologyBasic | ||
| ScanMultipleStripes_Direct | Locates multiple pairs of edges across a given path (without a scan map). Very fast detection of multiple pairs of opposite edges - usually for counting or width measurements.  | 
		MetrologyBasic | ||
| ScanSingleEdge | Locates the strongest transition between dark and bright pixels along a given path. Very fast detection of an object (e.g. horizontal displacement of a bottle) and simple measurements (e.g. liquid level in a bottle).  | 
		MetrologyBasic | ||
| ScanSingleEdge_Direct | Locates the strongest transition between dark and bright pixels along a given path (without a scan map). Very fast detection of an object (e.g. horizontal displacement of a bottle) and simple measurements (e.g. liquid level in a bottle).  | 
		MetrologyBasic | ||
| ScanSingleRidge | Locates the strongest dark or bright pixel peak along a given path. Very fast detection of a thin structure like a wire or a scale mark.  | 
		MetrologyBasic | ||
| ScanSingleRidge_Direct | Locates the strongest dark or bright pixel peak along a given path (without a scan map). Very fast detection of a thin structure like a wire or a scale mark.  | 
		MetrologyBasic | ||
| ScanSingleStripe | Locates the strongest pair of edges across a given path. Very fast detection or measurement of an object defined by a pair of opposite edges.  | 
		MetrologyBasic | ||
| ScanSingleStripe_Direct | Locates the strongest pair of edges across a given path (without a scan map). Very fast detection or measurement of an object defined by a pair of opposite edges.  | 
		MetrologyBasic | 
